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    High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation

    New search for: Chen, Z.
    New search for: Lenthe, W.
    New search for: Stinville, J. C.
    New search for: Echlin, M.
    New search for: Pollock, T. M.
    New search for: Daly, S.

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    High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation

    New search for: Chen, Z.
    New search for: Lenthe, W.
    New search for: Stinville, J. C.
    New search for: Echlin, M.
    New search for: Pollock, T. M.
    New search for: Daly, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation

    New search for: Chen, Z.
    New search for: Lenthe, W.
    New search for: Stinville, J. C.
    New search for: Echlin, M.
    New search for: Pollock, T. M.
    New search for: Daly, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation

    Contributors:

    Chen, Z. (author) / Lenthe, W. (author) / Stinville, J. C. (author) / Echlin, M. (author) / Pollock, T. M. (author) / Daly, S. (author)

    Published in:

    EXPERIMENTAL MECHANICS ; 58 ; 1407-1421

    Publication date:

    2018-01-01

    Size:

    15 pages

    ISSN:

    0014-4851

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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