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Degradation Behavior of BaTiO~3 Dielectrics for MLCCs by an Accelerated Life Test With Voltage and Temperature Stress Factors
Degradation Behavior of BaTiO~3 Dielectrics for MLCCs by an Accelerated Life Test With Voltage and Temperature Stress Factors
Degradation Behavior of BaTiO~3 Dielectrics for MLCCs by an Accelerated Life Test With Voltage and Temperature Stress Factors
Kim, Juyoung (Autor:in) / Lee, Seung-Hwan (Autor:in) / Yoon, Jung-Rag (Autor:in) / Van Tyne, Chester J. (Autor:in) / Ohk, Ki-Yool (Autor:in) / Lee, Heesoo (Autor:in)
Journal of testing and evaluation ; 44 ; 1593-1599
01.01.2016
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.0044
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