Degradation Behavior of BaTiO~3 Dielectrics for MLCCs by an Accelerated Life Test With Voltage and Temperature Stress Factors: Fid-Bau Portal

Degradation Behavior of BaTiO~3 Dielectrics for MLCCs by an Accelerated Life Test With Voltage and Temperature Stress Factors

Kim, Juyoung / Lee, Seung-Hwan / Yoon, Jung-Rag / Van Tyne, Chester J. / Ohk, Ki-Yool / Lee, Heesoo

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Degradation Behavior of BaTiO~3 Dielectrics for MLCCs by an Accelerated Life Test With Voltage and Temperature Stress Factors

Kim, Juyoung / Lee, Seung-Hwan / Yoon, Jung-Rag / Van Tyne, Chester J. / Ohk, Ki-Yool / Lee, Heesoo

Degradation Behavior of BaTiO~3 Dielectrics for MLCCs by an Accelerated Life Test With Voltage and Temperature Stress Factors

Kim, Juyoung / Lee, Seung-Hwan / Yoon, Jung-Rag / Van Tyne, Chester J. / Ohk, Ki-Yool / Lee, Heesoo

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Document information

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Document information

Title:

Degradation Behavior of BaTiO~3 Dielectrics for MLCCs by an Accelerated Life Test With Voltage and Temperature Stress Factors

Contributors:

Kim, Juyoung (author) / Lee, Seung-Hwan (author) / Yoon, Jung-Rag (author) / Van Tyne, Chester J. (author) / Ohk, Ki-Yool (author) / Lee, Heesoo (author)

Published in:

Journal of testing and evaluation ; 44 ; 1593-1599

Publication date:

2016-01-01

Size:

7 pages

ISSN:

0090-3973

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.0044

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