Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Dependence of Critical Current on Voltage Probe Spacing in Superconducting Tape with Multiple Small Cracks and a Large Crack
Dependence of Critical Current on Voltage Probe Spacing in Superconducting Tape with Multiple Small Cracks and a Large Crack
Dependence of Critical Current on Voltage Probe Spacing in Superconducting Tape with Multiple Small Cracks and a Large Crack
Ochiai, Shojiro (Autor:in) / Okuda, Hiroshi (Autor:in) / Fujii, Noriyuki (Autor:in)
Materials transactions ; 60 ; 574-582
01.01.2019
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.1105
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2018
|Tape Length-Dependence of Critical Current and n-Value in Coated Conductor with a Local Crack
British Library Online Contents | 2014
|Crack growth of physically small cracks
British Library Online Contents | 2007
|