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Features of Crack Size Distribution- and Voltage Probe Spacing-Dependences of Critical Current and n-Value in Cracked Superconducting Tape, Depicted by Simulation
Features of Crack Size Distribution- and Voltage Probe Spacing-Dependences of Critical Current and n-Value in Cracked Superconducting Tape, Depicted by Simulation
Features of Crack Size Distribution- and Voltage Probe Spacing-Dependences of Critical Current and n-Value in Cracked Superconducting Tape, Depicted by Simulation
Ochiai, Shojiro (Autor:in) / Okuda, Hiroshi (Autor:in) / Fujii, Noriyuki (Autor:in)
Materials transactions ; 59 ; 1628-1636
01.01.2018
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.1105
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