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XPS analysis and characterization of thin films Cu2ZnSnS4 grown using a novel solution based route
XPS analysis and characterization of thin films Cu2ZnSnS4 grown using a novel solution based route
XPS analysis and characterization of thin films Cu2ZnSnS4 grown using a novel solution based route
Calderón, C. (Autor:in) / Gordillo, G. (Autor:in) / Becerra, R. (Autor:in) / Bartolo-Pérez, P. (Autor:in)
Materials science in semiconductor processing ; 39 ; 492-498
01.01.2015
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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