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Microstructure evolution of amorphous silicon thin films upon annealing studied by positron annihilation
Microstructure evolution of amorphous silicon thin films upon annealing studied by positron annihilation
Microstructure evolution of amorphous silicon thin films upon annealing studied by positron annihilation
Wang, Xiaonan (Autor:in) / He, Xiaoyu (Autor:in) / Mao, Wenfeng (Autor:in) / Zhou, Yawei (Autor:in) / Lv, Shuliang (Autor:in) / He, Chunqing (Autor:in)
Materials science in semiconductor processing ; 56 ; 344-348
01.01.2016
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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