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    Microstructure evolution of amorphous silicon thin films upon annealing studied by positron annihilation

    New search for: Wang, Xiaonan
    New search for: He, Xiaoyu
    New search for: Mao, Wenfeng
    New search for: Zhou, Yawei
    New search for: Lv, Shuliang
    New search for: He, Chunqing

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    Microstructure evolution of amorphous silicon thin films upon annealing studied by positron annihilation

    New search for: Wang, Xiaonan
    New search for: He, Xiaoyu
    New search for: Mao, Wenfeng
    New search for: Zhou, Yawei
    New search for: Lv, Shuliang
    New search for: He, Chunqing

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Microstructure evolution of amorphous silicon thin films upon annealing studied by positron annihilation

    New search for: Wang, Xiaonan
    New search for: He, Xiaoyu
    New search for: Mao, Wenfeng
    New search for: Zhou, Yawei
    New search for: Lv, Shuliang
    New search for: He, Chunqing

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Microstructure evolution of amorphous silicon thin films upon annealing studied by positron annihilation

    Contributors:

    Wang, Xiaonan (author) / He, Xiaoyu (author) / Mao, Wenfeng (author) / Zhou, Yawei (author) / Lv, Shuliang (author) / He, Chunqing (author)

    Published in:

    Materials science in semiconductor processing ; 56 ; 344-348

    Publication date:

    2016-01-01

    Size:

    5 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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