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Fracture behavior of single crystal silicon with thermal oxide layer
Fracture behavior of single crystal silicon with thermal oxide layer
Fracture behavior of single crystal silicon with thermal oxide layer
Tsuchiya, Toshiyuki (Autor:in) / Miyamoto, Kenji (Autor:in) / Sugano, Koji (Autor:in) / Tabata, Osamu (Autor:in)
Engineering fracture mechanics ; 163 ; 523-532
01.01.2016
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.112605
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