Interface crack initiation due to nano-scale stress concentration

Sumigawa, T. / Shishido, T. / Murakami, T. et al. | British Library Online Contents | 2010

Single edge-crack stress intensity factor solutions

Freese, C. E. / Baratta, F. I. | British Library Online Contents | 2006

Stress intensity factors and T-stress for an edge interface crack by symplectic expansion

Zhou, Z. / Xu, X. / Leung, A. Y. T. et al. | British Library Online Contents | 2013

Delamination crack initiation from copper/silicon nitride interface edge with nanoscale singular stress field

Kawai, E. / Sanada, K. / Sumigawa, T. et al. | British Library Online Contents | 2014

Dominant stress region for crack initiation at interface edge of microdot on a substrate

Hirakata, H. / Takahashi, Y. / Matsumoto, S. et al. | British Library Online Contents | 2006