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Delamination crack initiation from copper/silicon nitride interface edge with nanoscale singular stress field
Delamination crack initiation from copper/silicon nitride interface edge with nanoscale singular stress field
Delamination crack initiation from copper/silicon nitride interface edge with nanoscale singular stress field
Kawai, E. (Autor:in) / Sanada, K. (Autor:in) / Sumigawa, T. (Autor:in) / Kitamura, T. (Autor:in)
ENGINEERING FRACTURE MECHANICS ; 120 ; 60-66
01.01.2014
7 pages
Aufsatz (Zeitschrift)
Englisch
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