Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Identification of 6H-SiC polar faces with pull-off force of atomic force microscopy
Identification of 6H-SiC polar faces with pull-off force of atomic force microscopy
Identification of 6H-SiC polar faces with pull-off force of atomic force microscopy
Gan, Di (Autor:in) / Song, Youting (Autor:in) / Yang, Junwei (Autor:in) / Chen, Hongxiang (Autor:in) / Guo, Liwei (Autor:in) / Chen, Xiaolong (Autor:in)
Applied surface science ; 390 ; 917-923
01.01.2016
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Identification of 6H-SiC polar faces with pull-off force of atomic force microscopy
British Library Online Contents | 2016
|Identification of 6H-SiC polar faces with pull-off force of atomic force microscopy
British Library Online Contents | 2016
|British Library Online Contents | 2004
|British Library Online Contents | 1995
|Noncontact Atomic Force Microscopy
TIBKAT | 2002
|