Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Raman and XPS characterization of vanadium oxide thin films with temperature
Raman and XPS characterization of vanadium oxide thin films with temperature
Raman and XPS characterization of vanadium oxide thin films with temperature
Ureña-Begara, Ferran (Autor:in) / Crunteanu, Aurelian (Autor:in) / Raskin, Jean-Pierre (Autor:in)
Applied surface science ; 403 ; 717-727
01.01.2017
11 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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