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    Raman and XPS characterization of vanadium oxide thin films with temperature

    New search for: Ureña-Begara, Ferran
    New search for: Crunteanu, Aurelian
    New search for: Raskin, Jean-Pierre

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    Raman and XPS characterization of vanadium oxide thin films with temperature

    New search for: Ureña-Begara, Ferran
    New search for: Crunteanu, Aurelian
    New search for: Raskin, Jean-Pierre

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Raman and XPS characterization of vanadium oxide thin films with temperature

    New search for: Ureña-Begara, Ferran
    New search for: Crunteanu, Aurelian
    New search for: Raskin, Jean-Pierre

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Raman and XPS characterization of vanadium oxide thin films with temperature

    Contributors:

    Ureña-Begara, Ferran (author) / Crunteanu, Aurelian (author) / Raskin, Jean-Pierre (author)

    Published in:

    Applied surface science ; 403 ; 717-727

    Publication date:

    2017-01-01

    Size:

    11 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.44

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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