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Ellipsometric characterization and optical anisotropy of nanostructured CuIn3S5 and CuIn5S8 thin films
Ellipsometric characterization and optical anisotropy of nanostructured CuIn3S5 and CuIn5S8 thin films
Ellipsometric characterization and optical anisotropy of nanostructured CuIn3S5 and CuIn5S8 thin films
Akkari, F. Chaffar (Autor:in) / Abdelkader, D. (Autor:in) / Gallas, B. (Autor:in) / Kanzari, M. (Autor:in)
Materials science in semiconductor processing ; 71 ; 156-160
01.01.2017
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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