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Spectroscopic ellipsometric characterization of approximant thin films of Al-Cr-Fe
Spectroscopic ellipsometric characterization of approximant thin films of Al-Cr-Fe
Spectroscopic ellipsometric characterization of approximant thin films of Al-Cr-Fe
Johann, L. (Autor:in) / En Naciri, A. (Autor:in) / Broch, L. (Autor:in) / Demange, V. (Autor:in) / Ghambaja, J. (Autor:in) / Machizaud, F. (Autor:in) / Dubois, J. M. (Autor:in)
APPLIED SURFACE SCIENCE ; 207 ; 300-305
01.01.2003
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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