Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Low sidelobe level and high time resolution for metallic ultrasonic testing with linear-chirp-Golay coded excitation
Low sidelobe level and high time resolution for metallic ultrasonic testing with linear-chirp-Golay coded excitation
Low sidelobe level and high time resolution for metallic ultrasonic testing with linear-chirp-Golay coded excitation
Zhang, Jiaying (Autor:in) / Gang, Tie (Autor:in) / Ye, Chaofeng (Autor:in) / Cong, Sen (Autor:in)
Nondestructive testing and evaluation ; 33 ; 213-228
01.01.2018
16 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.112705
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2014
|British Library Online Contents | 2000
|British Library Online Contents | 1996
|Nano-hardness testing with ultrasonic excitation
British Library Online Contents | 2005
|Savitzky and Golay differentiation in AES
British Library Online Contents | 1996
|