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Low sidelobe level and high time resolution for metallic ultrasonic testing with linear-chirp-Golay coded excitation
Low sidelobe level and high time resolution for metallic ultrasonic testing with linear-chirp-Golay coded excitation
Low sidelobe level and high time resolution for metallic ultrasonic testing with linear-chirp-Golay coded excitation
Zhang, Jiaying (author) / Gang, Tie (author) / Ye, Chaofeng (author) / Cong, Sen (author)
Nondestructive testing and evaluation ; 33 ; 213-228
2018-01-01
16 pages
Article (Journal)
English
DDC:
620.112705
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