Depth resolution and preferential sputtering in depth profiling of delta layers

Hofmann, S. / Lian, S.Y. / Han, Y.S. et al. | British Library Online Contents | 2018

Depth resolution and preferential sputtering in depth profiling of delta layers

Hofmann, S. / Lian, S.Y. / Han, Y.S. et al. | British Library Online Contents | 2018

Positron Depth-Profiling of Polymer Interfaces

Gidley, D. W. / DeMaggio, G. B. / Frieze, W. E. et al. | British Library Online Contents | 1997

Characterization of interfaces in nanoscale semiconductor devices by optimization of depth resolution in SIMS depth profiling

Chakraborty, B. R. | British Library Online Contents | 2004

Shave-off depth profiling: Depth profiling with an absolute depth scale

Nojima, M. / Maekawa, A. / Yamamoto, T. et al. | British Library Online Contents | 2006