Determining the thickness of aliphatic alcohol monolayers covalently attached to silicon oxide surfaces using angle-resolved X-ray photoelectron spectroscopy

Lee, Austin W.H. / Kim, Dongho / Gates, Byron D. | British Library Online Contents | 2018

Highly Angle-Resolved X-Ray Photoelectron Diffraction from Solid Surfaces

Tamura, K. / Shiraki, S. / Ishii, H. et al. | British Library Online Contents | 2003

Angle-resolved X-ray photoelectron spectroscopy study of the oxides on Nb surfaces for superconducting r.f. cavity applications

Ma, Q. / Rosenberg, R. A. | British Library Online Contents | 2003

Structural studies of functional organized molecular thin films using angle-resolved X-ray photoelectron spectroscopy

Yang, D.-Q. / Sun, Y. / Da, D.-A. | British Library Online Contents | 1999

Application of angle resolved X-ray photoelectron spectroscopy to the study of GaAs (001) surfaces and metal/GaAs (001) interfaces

Lepine, B. / Quemerais, A. / Jezequel, G. et al. | British Library Online Contents | 1994