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Band alignment at the Cu2SnS3/In2S3 interface measured by X-ray photoemission spectroscopy
Band alignment at the Cu2SnS3/In2S3 interface measured by X-ray photoemission spectroscopy
Band alignment at the Cu2SnS3/In2S3 interface measured by X-ray photoemission spectroscopy
Jia, Hongjie (Autor:in) / Cheng, Shuying (Autor:in) / Zhang, Hong (Autor:in) / Yu, Jinling (Autor:in) / Lai, Yunfeng (Autor:in)
Applied surface science ; 353 ; 414-418
01.01.2015
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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