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Phase transition analysis of thermochromic VO2 thin films by temperature-dependent Raman scattering and ellipsometry
Phase transition analysis of thermochromic VO2 thin films by temperature-dependent Raman scattering and ellipsometry
Phase transition analysis of thermochromic VO2 thin films by temperature-dependent Raman scattering and ellipsometry
Huang, Ying (Autor:in) / Zhang, Dongping (Autor:in) / Liu, Yi (Autor:in) / Jin, Jingcheng (Autor:in) / Yang, Yu (Autor:in) / Chen, Tao (Autor:in) / Guan, Huan (Autor:in) / Fan, Ping (Autor:in) / Lv, Weizhong (Autor:in)
Applied surface science ; 456 ; 545-551
01.01.2018
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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