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Phase transition analysis of thermochromic VO2 thin films by temperature-dependent Raman scattering and ellipsometry
Phase transition analysis of thermochromic VO2 thin films by temperature-dependent Raman scattering and ellipsometry
Phase transition analysis of thermochromic VO2 thin films by temperature-dependent Raman scattering and ellipsometry
Huang, Ying (author) / Zhang, Dongping (author) / Liu, Yi (author) / Jin, Jingcheng (author) / Yang, Yu (author) / Chen, Tao (author) / Guan, Huan (author) / Fan, Ping (author) / Lv, Weizhong (author)
Applied surface science ; 456 ; 545-551
2018-01-01
7 pages
Article (Journal)
English
DDC:
620.44
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