Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
ToF-SIMS analysis of an organic layer using toluene and its cluster ion beam projectiles generated by multiphoton ionization
ToF-SIMS analysis of an organic layer using toluene and its cluster ion beam projectiles generated by multiphoton ionization
ToF-SIMS analysis of an organic layer using toluene and its cluster ion beam projectiles generated by multiphoton ionization
Choi, Chang Min (Autor:in) / Lee, Sang Ju (Autor:in) / Baek, Ji Young (Autor:in) / Kim, Jeong Jin (Autor:in) / Choi, Myoung Choul (Autor:in)
Applied surface science ; 458 ; 805-809
01.01.2018
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Extremely low-energy projectiles for SIMS using size-selected gas cluster ions
| British Library Online Contents | 2008
Automated analysis of organic particles using cluster SIMS
| British Library Online Contents | 2004
Cluster SIMS using metal cluster complex ions
| British Library Online Contents | 2008
Energy dependence of projectiles on ion formation in electrospray droplet impact SIMS
| British Library Online Contents | 2008
| British Library Online Contents | 2006