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A platform for research: civil engineering, architecture and urbanism
ToF-SIMS analysis of an organic layer using toluene and its cluster ion beam projectiles generated by multiphoton ionization
ToF-SIMS analysis of an organic layer using toluene and its cluster ion beam projectiles generated by multiphoton ionization
ToF-SIMS analysis of an organic layer using toluene and its cluster ion beam projectiles generated by multiphoton ionization
Choi, Chang Min (author) / Lee, Sang Ju (author) / Baek, Ji Young (author) / Kim, Jeong Jin (author) / Choi, Myoung Choul (author)
Applied surface science ; 458 ; 805-809
2018-01-01
5 pages
Article (Journal)
English
DDC:
620.44
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