Temperature dependent study of basal plane stacking faults in Ag:ZnO nanorods by Raman and photoluminescence spectroscopy

Khranovskyy, Volodymyr / Sendova, Mariana / Hosterman, Brian et al. | British Library Online Contents | 2017

Room-Temperature Photoluminescence Observation of Stacking Faults in 3C-SiC

Hirano, R. / Tajima, M. / Itoh, K.M. | British Library Online Contents | 2010

Influence of Basal Plane Dislocation Induced Stacking Faults on the Current Gain in SiC BJTs

Agarwal, A. K. / Krishnaswami, S. / Richmond, J. et al. | British Library Online Contents | 2006

HREM study of basal stacking faults in GaN layers grown over sapphire substrate

Potin, V. / Gil, B. / Charar, S. et al. | British Library Online Contents | 2001

Micro-Raman Characterization of 4H-SiC Stacking Faults

Piluso, N. / Camarda, M. / Anzalone, R. et al. | British Library Online Contents | 2014