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Failure study of micron-sized flip-chip joints on passive RFID tags
Failure study of micron-sized flip-chip joints on passive RFID tags
Failure study of micron-sized flip-chip joints on passive RFID tags
Wang, Z.Y. (Autor:in) / Islam, M.S. (Autor:in) / Dong, L.H. (Autor:in) / Dong, Y.H. (Autor:in)
International journal of precision technology ; 2 ; 81-92
01.01.2011
12 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
670.5
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