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Slip bands in lamellar TiAl during high cycle fatigue microcompression by correlative total strain mapping, diffraction orientation mapping and transmission electron imaging
Slip bands in lamellar TiAl during high cycle fatigue microcompression by correlative total strain mapping, diffraction orientation mapping and transmission electron imaging
Slip bands in lamellar TiAl during high cycle fatigue microcompression by correlative total strain mapping, diffraction orientation mapping and transmission electron imaging
Edwards, Thomas Edward James (Autor:in) / Di Gioacchino, Fabio (Autor:in) / Goodfellow, Amy Jane (Autor:in) / Clegg, William John (Autor:in)
International journal of fatigue ; 124 ; 520-527
01.01.2019
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.1122
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