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Improved tritium retention modeling with reaction-diffusion code TMAP and bulk depth profiling capability
ITER-grade tungsten (W) specimens were exposed to similar deuterium (D) plasma condition (ion flux density of 6.0 × 1021 D m − 2s−1, D ion fluence of 5.0 × 1025 D m − 2) at the surface temperature of 623 K. Thermal desorption spectroscopy was used to measure total D retention in one W specimen after D plasma exposure. Glow-discharge optical emission spectroscopy was used to measure D depth profiling from the other W specimen exposed to the similar condition, and deep D trapping up to 25 μm was observed. When the normalized D depth profile was used with a reaction-diffusion code TMAP7 to model experimental D desorption behavior, an excellent agreement to experimental results was achieved. The modeling results suggested that the predominate mechanism of the deep D trapping might be D trapping in intrinsic intergranular cracks in ITER-grade W. Keyword: Tritium retention, Neutron-irradiation, Plasma facing-components
Improved tritium retention modeling with reaction-diffusion code TMAP and bulk depth profiling capability
ITER-grade tungsten (W) specimens were exposed to similar deuterium (D) plasma condition (ion flux density of 6.0 × 1021 D m − 2s−1, D ion fluence of 5.0 × 1025 D m − 2) at the surface temperature of 623 K. Thermal desorption spectroscopy was used to measure total D retention in one W specimen after D plasma exposure. Glow-discharge optical emission spectroscopy was used to measure D depth profiling from the other W specimen exposed to the similar condition, and deep D trapping up to 25 μm was observed. When the normalized D depth profile was used with a reaction-diffusion code TMAP7 to model experimental D desorption behavior, an excellent agreement to experimental results was achieved. The modeling results suggested that the predominate mechanism of the deep D trapping might be D trapping in intrinsic intergranular cracks in ITER-grade W. Keyword: Tritium retention, Neutron-irradiation, Plasma facing-components
Improved tritium retention modeling with reaction-diffusion code TMAP and bulk depth profiling capability
M. Shimada (Autor:in) / C.N. Taylor (Autor:in)
2019
Aufsatz (Zeitschrift)
Elektronische Ressource
Unbekannt
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