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    SINTERED SILICON NITRIDE CERAMIC

    Neue Suche nach: ONISHI HIROSHI
    Neue Suche nach: IKEDA HIROSHI
    Neue Suche nach: TAKIMOTO HIROKI
    Neue Suche nach: UEMURA HIROSHI
    Neue Suche nach: YAMADA KENJI
    Neue Suche nach: ONO HIDEKI
    Neue Suche nach: MATSUYAMA HIROYUKI

    A ceramic-sphere inspection device is provided with which a ceramic sphere is inspected for a flaw present in the surface layer and for snow flakes without destroying the ceramic sphere. The device is a ceramic-sphere inspection device (100) in which a ceramic sphere (S) is rotatably supported in a given position and illuminating light emitted from a light projector (110) is detected with a light receiver (120) to evaluate the state of the inner part of the surface layer, and has been configured so that the light receiver (120) does not detect the light emitted from the light projector (110) and reflected at the surface of the ceramic sphere.

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    SINTERED SILICON NITRIDE CERAMIC

    Neue Suche nach: ONISHI HIROSHI
    Neue Suche nach: IKEDA HIROSHI
    Neue Suche nach: TAKIMOTO HIROKI
    Neue Suche nach: UEMURA HIROSHI
    Neue Suche nach: YAMADA KENJI
    Neue Suche nach: ONO HIDEKI
    Neue Suche nach: MATSUYAMA HIROYUKI

    A ceramic-sphere inspection device is provided with which a ceramic sphere is inspected for a flaw present in the surface layer and for snow flakes without destroying the ceramic sphere. The device is a ceramic-sphere inspection device (100) in which a ceramic sphere (S) is rotatably supported in a given position and illuminating light emitted from a light projector (110) is detected with a light receiver (120) to evaluate the state of the inner part of the surface layer, and has been configured so that the light receiver (120) does not detect the light emitted from the light projector (110) and reflected at the surface of the ceramic sphere.

    Zugriff

    Download

    SINTERED SILICON NITRIDE CERAMIC

    Neue Suche nach: ONISHI HIROSHI
    Neue Suche nach: IKEDA HIROSHI
    Neue Suche nach: TAKIMOTO HIROKI
    Neue Suche nach: UEMURA HIROSHI
    Neue Suche nach: YAMADA KENJI
    Neue Suche nach: ONO HIDEKI
    Neue Suche nach: MATSUYAMA HIROYUKI

    A ceramic-sphere inspection device is provided with which a ceramic sphere is inspected for a flaw present in the surface layer and for snow flakes without destroying the ceramic sphere. The device is a ceramic-sphere inspection device (100) in which a ceramic sphere (S) is rotatably supported in a given position and illuminating light emitted from a light projector (110) is detected with a light receiver (120) to evaluate the state of the inner part of the surface layer, and has been configured so that the light receiver (120) does not detect the light emitted from the light projector (110) and reflected at the surface of the ceramic sphere.

    Zugriff

    Download

    Zugriff

    Download

    Seitennavigation

    Dokumentinformationen
    Ähnliche Titel

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    Dokumentinformationen
    Titel:

    SINTERED SILICON NITRIDE CERAMIC

    Weitere Titelangaben:

    GESINTERTE SILIZIUMNITRID KERAMIK
    CERAMIQUE FRITTEE A BASE DE NITRURE DE SILICIUM

    Beteiligte:

    ONISHI HIROSHI (Autor:in) / IKEDA HIROSHI (Autor:in) / TAKIMOTO HIROKI (Autor:in) / UEMURA HIROSHI (Autor:in) / YAMADA KENJI (Autor:in) / ONO HIDEKI (Autor:in) / MATSUYAMA HIROYUKI (Autor:in)

    Erscheinungsdatum:

    09.01.2019

    Medientyp:

    Patent

    Format:

    Elektronische Ressource

    Sprache:

    Englisch

    Klassifikation:

    IPC:  C04B Kalk , LIME / F16C SHAFTS , Wellen / G01N Untersuchen oder Analysieren von Stoffen durch Bestimmen ihrer chemischen oder physikalischen Eigenschaften , INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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