Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
PIEZOELECTRIC FILM AND PIEZOELECTRIC ELEMENT INCLUDING THE SAME, AND LIQUID DISCHARGE DEVICE
PROBLEM TO BE SOLVED: To provide a piezoelectric film with high piezoelectricity; a piezoelectric element including such a piezoelectric film; and a liquid discharge device.SOLUTION: A piezoelectric film of the present invention is one grown by vapor phase growth. The piezoelectric film comprises: a perovskite type oxide arranged by doping a perovskite type oxide expressed by the general formula P below with Si by 0.2-0.5 mol%. The ratio of the peak intensity of a pyrochlore phase to the total of peak intensities of perovskite phases in (100)-, (001)-, (110)-, (101)- and (111)-planes which are measured by X-ray diffraction method is 0.25 or less. General Formula P: A[(ZrTi)Nb]O, where A is an A site element including Pb as a primary component; Zr, Ti, and Nb are each a B site element; x is between 0 and 1; a is 0.1 to less than 0.3.SELECTED DRAWING: Figure 6
【課題】圧電特性が高い圧電体膜及びその圧電体膜を備えた圧電素子及び液体吐出装置を提供する。【解決手段】本発明の圧電体膜は、気相成長法により成膜されてなる圧電体膜であって、下記一般式Pで表されるペロブスカイト型酸化物にSiが0.2mol%以上0.5mol%以下ドープされてなるペロブスカイト型酸化物を含み、X線回折法により測定されたペロブスカイト相の(100)、(001)、(110)、(101)及び(111)の各面方位におけるピーク強度の総和に対するパイロクロア相のピーク強度の比が0.25以下である。A1+δ[(ZrxTi1−x)1−aNba]Oy・・・一般式P但し、式P中、AはPbを主成分とするAサイト元素、Zr,Ti,及びNbはBサイト元素。xは0超1未満、aは0.1以上0.3未満。【選択図】図6
PIEZOELECTRIC FILM AND PIEZOELECTRIC ELEMENT INCLUDING THE SAME, AND LIQUID DISCHARGE DEVICE
PROBLEM TO BE SOLVED: To provide a piezoelectric film with high piezoelectricity; a piezoelectric element including such a piezoelectric film; and a liquid discharge device.SOLUTION: A piezoelectric film of the present invention is one grown by vapor phase growth. The piezoelectric film comprises: a perovskite type oxide arranged by doping a perovskite type oxide expressed by the general formula P below with Si by 0.2-0.5 mol%. The ratio of the peak intensity of a pyrochlore phase to the total of peak intensities of perovskite phases in (100)-, (001)-, (110)-, (101)- and (111)-planes which are measured by X-ray diffraction method is 0.25 or less. General Formula P: A[(ZrTi)Nb]O, where A is an A site element including Pb as a primary component; Zr, Ti, and Nb are each a B site element; x is between 0 and 1; a is 0.1 to less than 0.3.SELECTED DRAWING: Figure 6
【課題】圧電特性が高い圧電体膜及びその圧電体膜を備えた圧電素子及び液体吐出装置を提供する。【解決手段】本発明の圧電体膜は、気相成長法により成膜されてなる圧電体膜であって、下記一般式Pで表されるペロブスカイト型酸化物にSiが0.2mol%以上0.5mol%以下ドープされてなるペロブスカイト型酸化物を含み、X線回折法により測定されたペロブスカイト相の(100)、(001)、(110)、(101)及び(111)の各面方位におけるピーク強度の総和に対するパイロクロア相のピーク強度の比が0.25以下である。A1+δ[(ZrxTi1−x)1−aNba]Oy・・・一般式P但し、式P中、AはPbを主成分とするAサイト元素、Zr,Ti,及びNbはBサイト元素。xは0超1未満、aは0.1以上0.3未満。【選択図】図6
PIEZOELECTRIC FILM AND PIEZOELECTRIC ELEMENT INCLUDING THE SAME, AND LIQUID DISCHARGE DEVICE
圧電体膜及びそれを備えた圧電素子、及び液体吐出装置
MURAKAMI NAOKI (Autor:in)
02.06.2016
Patent
Elektronische Ressource
Japanisch
Piezoelectric film, piezoelectric element including the same, and liquid discharge apparatus
Europäisches Patentamt | 2018
|PIEZOELECTRIC FILM, PIEZOELECTRIC ELEMENT INCLUDING THE SAME, AND LIQUID DISCHARGE APPARATUS
Europäisches Patentamt | 2017
|PIEZOELECTRIC FILM AND PIEZOELECTRIC ELEMENT PROVIDED WITH SAME, AND LIQUID DISCHARGE DEVICE
Europäisches Patentamt | 2016
|Europäisches Patentamt | 2016
|PIEZOELECTRIC MATERIAL, PIEZOELECTRIC ELEMENT, AND LIQUID DISCHARGE HEAD
Europäisches Patentamt | 2023
|