Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
MEASUREMENT METHOD, MEASUREMENT APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT PROGRAM
To provide a measurement method for calculating a deflection waveform of a structure caused by a moving body which moves on the structure without measuring displacement of the structure.SOLUTION: A measurement method includes: a step of acquiring first observation point information including the time when each of the sections of a moving body passes through a first observation point of a structure and physical quantity which is a response to an action to be applied to the first observation point by the sections, on the basis of observation information obtained by an observation apparatus; a step of acquiring second observation point information including the time when the sections pass through a second observation point and physical quantity which is a response to an action to be applied to the second observation point by the sections, on the basis of the observation information; a step of calculating a deflection waveform of the structure caused by the sections on the basis of the first observation point information, the second observation point information, a predetermined coefficient, and an approximate expression of deflection of the structure; and a step of calculating a deflection waveform of the structure caused by the moving body by adding deflection waveforms of the structure caused by the sections.SELECTED DRAWING: Figure 20
【課題】構造物の変位を計測せずに構造物を移動する移動体による構造物のたわみ波形を算出可能な計測方法を提供すること。【解決手段】観測装置による観測情報に基づいて、移動体の複数の部位が構造物の第1の観測点を通過した時刻及び前記複数の部位の前記第1の観測点への作用に対する応答である物理量を含む第1観測点情報を取得するステップと、前記観測情報に基づいて、前記複数の部位が第2の観測点を通過した時刻及び前記複数の部位の前記第2の観測点への作用に対する応答である物理量を含む第2観測点情報を取得するステップと、前記第1観測点情報及び前記第2観測点情報と、所定の係数と、前記構造物のたわみの近似式とに基づいて、前記複数の部位による前記構造物のたわみ波形を算出するステップと、前記複数の部位による前記構造物のたわみ波形を加算して、前記移動体による前記構造物のたわみ波形を算出するステップと、を含む、計測方法。【選択図】図20
MEASUREMENT METHOD, MEASUREMENT APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT PROGRAM
To provide a measurement method for calculating a deflection waveform of a structure caused by a moving body which moves on the structure without measuring displacement of the structure.SOLUTION: A measurement method includes: a step of acquiring first observation point information including the time when each of the sections of a moving body passes through a first observation point of a structure and physical quantity which is a response to an action to be applied to the first observation point by the sections, on the basis of observation information obtained by an observation apparatus; a step of acquiring second observation point information including the time when the sections pass through a second observation point and physical quantity which is a response to an action to be applied to the second observation point by the sections, on the basis of the observation information; a step of calculating a deflection waveform of the structure caused by the sections on the basis of the first observation point information, the second observation point information, a predetermined coefficient, and an approximate expression of deflection of the structure; and a step of calculating a deflection waveform of the structure caused by the moving body by adding deflection waveforms of the structure caused by the sections.SELECTED DRAWING: Figure 20
【課題】構造物の変位を計測せずに構造物を移動する移動体による構造物のたわみ波形を算出可能な計測方法を提供すること。【解決手段】観測装置による観測情報に基づいて、移動体の複数の部位が構造物の第1の観測点を通過した時刻及び前記複数の部位の前記第1の観測点への作用に対する応答である物理量を含む第1観測点情報を取得するステップと、前記観測情報に基づいて、前記複数の部位が第2の観測点を通過した時刻及び前記複数の部位の前記第2の観測点への作用に対する応答である物理量を含む第2観測点情報を取得するステップと、前記第1観測点情報及び前記第2観測点情報と、所定の係数と、前記構造物のたわみの近似式とに基づいて、前記複数の部位による前記構造物のたわみ波形を算出するステップと、前記複数の部位による前記構造物のたわみ波形を加算して、前記移動体による前記構造物のたわみ波形を算出するステップと、を含む、計測方法。【選択図】図20
MEASUREMENT METHOD, MEASUREMENT APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT PROGRAM
計測方法、計測装置、計測システム及び計測プログラム
KOBAYASHI SACHIHIRO (Autor:in)
27.09.2021
Patent
Elektronische Ressource
Japanisch
MEASUREMENT METHOD, MEASUREMENT APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT PROGRAM
Europäisches Patentamt | 2021
|MEASUREMENT METHOD, MEASUREMENT APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT PROGRAM
Europäisches Patentamt | 2021
|MEASUREMENT METHOD, MEASUREMENT APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT PROGRAM
Europäisches Patentamt | 2021
|MEASUREMENT METHOD, MEASUREMENT APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT PROGRAM
Europäisches Patentamt | 2021
|MEASUREMENT METHOD, MEASUREMENT APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT PROGRAM
Europäisches Patentamt | 2021
|