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Diffraction Patterns

Williams, David B. / Carter, C. Barry

Abstract This chapter will set the stage for our discussion of imaging using diffraction contrast. Put simply, diffraction contrast arises because the intensity of the diffracted beams is different in different regions of the specimen. These variations may arise because of changing diffracting conditions or because of differences in specimen thickness. In our study of diffraction in the TEM, we will see spots—lots of them. Sometimes the “spots” will be small faint points and other times they will be large disks, which themselves contain “structure” and more information. Other patterns will contain lines which we will examine in Chapters 19 to 21.

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Diffraction Patterns

Williams, David B. / Carter, C. Barry

Abstract This chapter will set the stage for our discussion of imaging using diffraction contrast. Put simply, diffraction contrast arises because the intensity of the diffracted beams is different in different regions of the specimen. These variations may arise because of changing diffracting conditions or because of differences in specimen thickness. In our study of diffraction in the TEM, we will see spots—lots of them. Sometimes the “spots” will be small faint points and other times they will be large disks, which themselves contain “structure” and more information. Other patterns will contain lines which we will examine in Chapters 19 to 21.

Diffraction Patterns

Williams, David B. / Carter, C. Barry

Abstract This chapter will set the stage for our discussion of imaging using diffraction contrast. Put simply, diffraction contrast arises because the intensity of the diffracted beams is different in different regions of the specimen. These variations may arise because of changing diffracting conditions or because of differences in specimen thickness. In our study of diffraction in the TEM, we will see spots—lots of them. Sometimes the “spots” will be small faint points and other times they will be large disks, which themselves contain “structure” and more information. Other patterns will contain lines which we will examine in Chapters 19 to 21.

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Titel:

Diffraction Patterns

Beteiligte:

Williams, David B. (Autor:in) / Carter, C. Barry (Autor:in)

Erschienen in:

Transmission Electron Microscopy ; 177-189

Erscheinungsdatum:

01.01.1996

Format / Umfang:

13 pages

ISBN:

978-0-306-45324-3 , 978-1-4757-2519-3

DOI:

https://doi.org/10.1007/978-1-4757-2519-3_11

Medientyp:

Aufsatz/Kapitel (Buch)

Format:

Elektronische Ressource

Sprache:

Englisch

Schlagwörter:

Bragg Angle , Bragg Reflection , Diffract Beam , Path Difference , Spherical Aberration Physics , Spectroscopy and Microscopy , Surface and Interface Science, Thin Films , Solid State Physics , Characterization and Evaluation of Materials , Biological Microscopy

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