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Diffraction Patterns
Abstract This chapter will set the stage for our discussion of imaging using diffraction contrast. Put simply, diffraction contrast arises because the intensity of the diffracted beams is different in different regions of the specimen. These variations may arise because of changing diffracting conditions or because of differences in specimen thickness. In our study of diffraction in the TEM, we will see spots—lots of them. Sometimes the “spots” will be small faint points and other times they will be large disks, which themselves contain “structure” and more information. Other patterns will contain lines which we will examine in Chapters 19 to 21.
Diffraction Patterns
Abstract This chapter will set the stage for our discussion of imaging using diffraction contrast. Put simply, diffraction contrast arises because the intensity of the diffracted beams is different in different regions of the specimen. These variations may arise because of changing diffracting conditions or because of differences in specimen thickness. In our study of diffraction in the TEM, we will see spots—lots of them. Sometimes the “spots” will be small faint points and other times they will be large disks, which themselves contain “structure” and more information. Other patterns will contain lines which we will examine in Chapters 19 to 21.
Diffraction Patterns
Williams, David B. (author) / Carter, C. Barry (author)
Transmission Electron Microscopy ; 177-189
1996-01-01
13 pages
Article/Chapter (Book)
Electronic Resource
English
Springer Verlag | 1996
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