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Short Range Bonding Interaction at Metal-Metal Interfaces

Bennett, Wayne R. / Leavitt, John A. / Falco, Charles M.

Abstract Using the techniques discussed by Falco, Bennett, and Boufelfel (in this volume), freshly deposited Mo surfaces were exposed to a beam of sputtered Ta atoms for varying, controlled lengths of time. The resultant number of deposited Ta atoms/cm2 (from here on referred to as Ta coverage) was subsequently measured using Rutherford Backscattering (RBS).

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Short Range Bonding Interaction at Metal-Metal Interfaces

Bennett, Wayne R. / Leavitt, John A. / Falco, Charles M.

Abstract Using the techniques discussed by Falco, Bennett, and Boufelfel (in this volume), freshly deposited Mo surfaces were exposed to a beam of sputtered Ta atoms for varying, controlled lengths of time. The resultant number of deposited Ta atoms/cm2 (from here on referred to as Ta coverage) was subsequently measured using Rutherford Backscattering (RBS).

Short Range Bonding Interaction at Metal-Metal Interfaces

Bennett, Wayne R. / Leavitt, John A. / Falco, Charles M.

Abstract Using the techniques discussed by Falco, Bennett, and Boufelfel (in this volume), freshly deposited Mo surfaces were exposed to a beam of sputtered Ta atoms for varying, controlled lengths of time. The resultant number of deposited Ta atoms/cm2 (from here on referred to as Ta coverage) was subsequently measured using Rutherford Backscattering (RBS).

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Titel:

Short Range Bonding Interaction at Metal-Metal Interfaces

Beteiligte:

Bennett, Wayne R. (Autor:in) / Leavitt, John A. (Autor:in) / Falco, Charles M. (Autor:in)

Erschienen in:

Dynamical Phenomena at Surfaces, Interfaces and Superlattices ; 62-63

Springer Series in Surface Sciences ; 3

Erscheinungsdatum:

01.01.1985

Format / Umfang:

2 pages

ISBN:

978-3-642-82537-8 , 978-3-642-82535-4

ISSN:

DOI:

https://doi.org/10.1007/978-3-642-82535-4_6

Medientyp:

Aufsatz/Kapitel (Buch)

Format:

Elektronische Ressource

Sprache:

Englisch

Schlagwörter:

Sapphire Substrate , Rutherford Backscatter , Sticking Coefficient , Resultant Number , Material Science Division Physics , Surface and Interface Science, Thin Films , Surfaces and Interfaces, Thin Films

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