Short Range Bonding Interaction at Metal-Metal Interfaces: Fid-Bau Portal

Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

Short Range Bonding Interaction at Metal-Metal Interfaces

Bennett, Wayne R. / Leavitt, John A. / Falco, Charles M.

Abstract Using the techniques discussed by Falco, Bennett, and Boufelfel (in this volume), freshly deposited Mo surfaces were exposed to a beam of sputtered Ta atoms for varying, controlled lengths of time. The resultant number of deposited Ta atoms/cm2 (from here on referred to as Ta coverage) was subsequently measured using Rutherford Backscattering (RBS).

Access

Check availability in my library

Order at Subito €

Page navigation

Document information

Export, share and cite

Short Range Bonding Interaction at Metal-Metal Interfaces

Bennett, Wayne R. / Leavitt, John A. / Falco, Charles M.

Abstract Using the techniques discussed by Falco, Bennett, and Boufelfel (in this volume), freshly deposited Mo surfaces were exposed to a beam of sputtered Ta atoms for varying, controlled lengths of time. The resultant number of deposited Ta atoms/cm2 (from here on referred to as Ta coverage) was subsequently measured using Rutherford Backscattering (RBS).

Short Range Bonding Interaction at Metal-Metal Interfaces

Bennett, Wayne R. / Leavitt, John A. / Falco, Charles M.

Abstract Using the techniques discussed by Falco, Bennett, and Boufelfel (in this volume), freshly deposited Mo surfaces were exposed to a beam of sputtered Ta atoms for varying, controlled lengths of time. The resultant number of deposited Ta atoms/cm2 (from here on referred to as Ta coverage) was subsequently measured using Rutherford Backscattering (RBS).

Access

Check availability in my library

Order at Subito €

Page navigation

Document information

Export, share and cite

Document information

Title:

Short Range Bonding Interaction at Metal-Metal Interfaces

Contributors:

Bennett, Wayne R. (author) / Leavitt, John A. (author) / Falco, Charles M. (author)

Published in:

Dynamical Phenomena at Surfaces, Interfaces and Superlattices ; 62-63

Springer Series in Surface Sciences ; 3

Publication date:

1985-01-01

Size:

2 pages

ISBN:

978-3-642-82537-8 , 978-3-642-82535-4

ISSN:

DOI:

https://doi.org/10.1007/978-3-642-82535-4_6

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Sapphire Substrate , Rutherford Backscatter , Sticking Coefficient , Resultant Number , Material Science Division Physics , Surface and Interface Science, Thin Films , Surfaces and Interfaces, Thin Films

Similar titles

Characterizing the bonding mechanisms at silane-metal interfaces: A model system

Quinton, J. S. / Dastoor, R. C. | British Library Online Contents | 1999

Bonding and wetting in non-reactive metal/SiC systems: weak or strong interfaces?

Rado, C. / Kalogeropoulou, S. / Eustathopoulos, N. | British Library Online Contents | 2000

Anomalous Elastic Properties of Metal-Metal Interfaces

Harms, U. / Schwarz, R. B. | British Library Online Contents | 2002

EQUIPOTENTIAL BONDING METAL FITTING

WATARI AKIHIRO | European Patent Office | 2021

Free access

Metal/ceramic bonding article

TSUKAGUCHI NOBUYOSHI / NAKAMURA JYUNJI / WADA MASAHIKO et al. | European Patent Office | 2017

Free access