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Surface Structure Study by High-Resolution Electron Microscopy and Diffraction

Takayanagi, K.

Abstract Structures of reconstructed surfaces and adsorbed layers are studied in-situ by UHV electron microscopy and diffraction. Transmission electron diffraction is useful for determining long range ordered structures such as Si(111)7×7 and also short range ordered structures using kinematical approximation. High-resolution electron microscopy at UHV can reveal local structures at atomic level resolution in transmission mode and at sub-nm resolution in reflection mode. Observations of the phase transition of Si(111) −7×7 to 1×1 and adsorption processes give finer information on structural details.

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Surface Structure Study by High-Resolution Electron Microscopy and Diffraction

Takayanagi, K.

Abstract Structures of reconstructed surfaces and adsorbed layers are studied in-situ by UHV electron microscopy and diffraction. Transmission electron diffraction is useful for determining long range ordered structures such as Si(111)7×7 and also short range ordered structures using kinematical approximation. High-resolution electron microscopy at UHV can reveal local structures at atomic level resolution in transmission mode and at sub-nm resolution in reflection mode. Observations of the phase transition of Si(111) −7×7 to 1×1 and adsorption processes give finer information on structural details.

Surface Structure Study by High-Resolution Electron Microscopy and Diffraction

Takayanagi, K.

Abstract Structures of reconstructed surfaces and adsorbed layers are studied in-situ by UHV electron microscopy and diffraction. Transmission electron diffraction is useful for determining long range ordered structures such as Si(111)7×7 and also short range ordered structures using kinematical approximation. High-resolution electron microscopy at UHV can reveal local structures at atomic level resolution in transmission mode and at sub-nm resolution in reflection mode. Observations of the phase transition of Si(111) −7×7 to 1×1 and adsorption processes give finer information on structural details.

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Titel:

Surface Structure Study by High-Resolution Electron Microscopy and Diffraction

Beteiligte:

Takayanagi, K. (Autor:in)

Erschienen in:

Solvay Conference on Surface Science ; 55-60

Springer Series in Surface Sciences ; 14

Erscheinungsdatum:

01.01.1988

Format / Umfang:

6 pages

ISBN:

978-3-642-74220-0 , 978-3-642-74218-7

ISSN:

DOI:

https://doi.org/10.1007/978-3-642-74218-7_5

Medientyp:

Aufsatz/Kapitel (Buch)

Format:

Elektronische Ressource

Sprache:

Englisch

Schlagwörter:

Short Range Order , Superlattice Reflection , Imaging Electron Beam , Bulk Layer , Kinematical Approximation Physics , Surface and Interface Science, Thin Films , Surfaces and Interfaces, Thin Films

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