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    Effective Stress Intensity Factor of an Atomistically Modeled Crack in Beta Silicon Carbide

    New search for: Sawamura, A.
    New search for: Watanabe, Y.
    New search for: Yamamoto, R.
    New search for: Doyama, M.

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    Effective Stress Intensity Factor of an Atomistically Modeled Crack in Beta Silicon Carbide

    New search for: Sawamura, A.
    New search for: Watanabe, Y.
    New search for: Yamamoto, R.
    New search for: Doyama, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effective Stress Intensity Factor of an Atomistically Modeled Crack in Beta Silicon Carbide

    New search for: Sawamura, A.
    New search for: Watanabe, Y.
    New search for: Yamamoto, R.
    New search for: Doyama, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Effective Stress Intensity Factor of an Atomistically Modeled Crack in Beta Silicon Carbide

    Contributors:

    Sawamura, A. (author) / Watanabe, Y. (author) / Yamamoto, R. (author) / Doyama, M.

    Conference:

    2nd International conference on computer applications to materials and molecular science and engineering, Computer aided innovation of new materials ; 1992 ; Yokohama; Japan

    Published in:

    Computer aided innovation of new materials ; 599-602

    COMPUTER AIDED INNOVATION OF NEW MATERIALS

    Publication date:

    1993-01-01

    Size:

    4 pages

    Remarks:

    In 2 pts. Also known as CAMSE 92

    ISBN:

    044489778X

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    computer applications , materials science , computer aided innovation , new materials , CAMSE , materials engineering , molecular science

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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