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    FTIR reflectance characterization of SIMOX buried oxide layers [3425-01]

    New search for: Yakovlev, V. A.
    New search for: Charpenay, S.
    New search for: Rosenthal, P. A.
    New search for: Solomon, P. R.
    New search for: Datla, R. V.
    New search for: Hanssen, L. M.
    New search for: SPIE

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    FTIR reflectance characterization of SIMOX buried oxide layers [3425-01]

    New search for: Yakovlev, V. A.
    New search for: Charpenay, S.
    New search for: Rosenthal, P. A.
    New search for: Solomon, P. R.
    New search for: Datla, R. V.
    New search for: Hanssen, L. M.
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    FTIR reflectance characterization of SIMOX buried oxide layers [3425-01]

    New search for: Yakovlev, V. A.
    New search for: Charpenay, S.
    New search for: Rosenthal, P. A.
    New search for: Solomon, P. R.
    New search for: Datla, R. V.
    New search for: Hanssen, L. M.
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    FTIR reflectance characterization of SIMOX buried oxide layers [3425-01]

    Contributors:

    Yakovlev, V. A. (author) / Charpenay, S. (author) / Rosenthal, P. A. (author) / Solomon, P. R. (author) / Datla, R. V. / Hanssen, L. M. / SPIE

    Conference:

    Conference, Optical diagnostic methods for inorganic transmissive materials ; 1998 ; San Diego; CA

    Published in:

    Optical diagnostic methods for inorganic transmissive materials ; 2-9

    PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING

    Publication date:

    1998-01-01

    Size:

    8 pages

    ISBN:

    0819428809

    ISSN:

    0277-786X

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    optical diagnostic methods , inorganic transmissive materials , SPIE , transmissive materials

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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