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    Thin-film SOI n-MOSFET low-frequency noise measurements at elevated temperatures

    New search for: Dessard, V.
    New search for: Eggermont, J. P.
    New search for: Flandre, D.
    New search for: Golecki, I.
    New search for: Engineering Foundation

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    Thin-film SOI n-MOSFET low-frequency noise measurements at elevated temperatures

    New search for: Dessard, V.
    New search for: Eggermont, J. P.
    New search for: Flandre, D.
    New search for: Golecki, I.
    New search for: Engineering Foundation

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thin-film SOI n-MOSFET low-frequency noise measurements at elevated temperatures

    New search for: Dessard, V.
    New search for: Eggermont, J. P.
    New search for: Flandre, D.
    New search for: Golecki, I.
    New search for: Engineering Foundation

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Thin-film SOI n-MOSFET low-frequency noise measurements at elevated temperatures

    Contributors:

    Dessard, V. (author) / Eggermont, J. P. (author) / Flandre, D. (author) / Golecki, I. / Engineering Foundation

    Conference:

    High-temperature electronic materials, devices and sensors conference ; 1998 ; San Diego; CA

    Published in:

    High-temperature electronic materials, devices and sensors conference ; 94-99

    HIGH TEMPERATURE ELECTRONIC DEVICES AND SENSORS CONFERENCE

    Publication date:

    1998-01-01

    Size:

    6 pages

    Remarks:

    IEEE cat no 98EX132

    ISBN:

    0780347375 , 0780344383

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    high temperature electronic materials , electronic materials

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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