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    Characterization of Si nanostructured surfaces [3790-16]

    New search for: Zaidi, S. H.
    New search for: Gee, J. M.
    New search for: Ruby, D. S.
    New search for: Brueck, S. R. J.
    New search for: Lakhtakia, A.
    New search for: Messier, R. F.
    New search for: SPIE

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    Characterization of Si nanostructured surfaces [3790-16]

    New search for: Zaidi, S. H.
    New search for: Gee, J. M.
    New search for: Ruby, D. S.
    New search for: Brueck, S. R. J.
    New search for: Lakhtakia, A.
    New search for: Messier, R. F.
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of Si nanostructured surfaces [3790-16]

    New search for: Zaidi, S. H.
    New search for: Gee, J. M.
    New search for: Ruby, D. S.
    New search for: Brueck, S. R. J.
    New search for: Lakhtakia, A.
    New search for: Messier, R. F.
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    Characterization of Si nanostructured surfaces [3790-16]

    Contributors:

    Zaidi, S. H. (author) / Gee, J. M. (author) / Ruby, D. S. (author) / Brueck, S. R. J. (author) / Lakhtakia, A. / Messier, R. F. / SPIE

    Conference:

    Conference, Engineered nanostructural films and materials ; 1999 ; Denver; CO

    Published in:

    Engineered nanostructural films and materials ; 151-159

    PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING

    Publication date:

    1999-01-01

    Size:

    9 pages

    ISBN:

    0819432768

    ISSN:

    0277-786X

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    nanostructural films , materials , SPIE

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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