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    Potential challenges in near-field scanning optical microscopy for space applications [4098-03]

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    Potential challenges in near-field scanning optical microscopy for space applications [4098-03]

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    Potential challenges in near-field scanning optical microscopy for space applications [4098-03]

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    Document information
    Title:

    Potential challenges in near-field scanning optical microscopy for space applications [4098-03]

    Contributors:

    Vikram, C. S. (author) / Witherow, W. K. (author) / Andrews, D. L. / SPIE - International Society for Optical Engineering

    Conference:

    Conference, Optical devices and diagnostics in materials science ; 2000 ; San Diego, CA

    Published in:

    Optical devices and diagnostics in materials science ; 26-30

    PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4098

    Publication date:

    2000-01-01

    Size:

    5 pages

    ISBN:

    0819437433

    ISSN:

    0277-786X

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    optical devices , SPIE , materials science , optical engineering

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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