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Measurement of elastic properties of thin films by surface Brillouin scattering [4098-41]

Beghi, M. G. / Bottani, C. E. / Pastorelli, R. / SPIE - International Society for Optical Engineering

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Measurement of elastic properties of thin films by surface Brillouin scattering [4098-41]

Beghi, M. G. / Bottani, C. E. / Pastorelli, R. / SPIE - International Society for Optical Engineering

Measurement of elastic properties of thin films by surface Brillouin scattering [4098-41]

Beghi, M. G. / Bottani, C. E. / Pastorelli, R. / SPIE - International Society for Optical Engineering

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Document information

Title:

Measurement of elastic properties of thin films by surface Brillouin scattering [4098-41]

Contributors:

Beghi, M. G. (author) / Bottani, C. E. (author) / Pastorelli, R. (author) / Andrews, D. L. / SPIE - International Society for Optical Engineering

Conference:

Conference, Optical devices and diagnostics in materials science ; 2000 ; San Diego, CA

Published in:

Optical devices and diagnostics in materials science ; 252-263

PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4098

Publication date:

2000-01-01

Size:

12 pages

ISBN:

0819437433

ISSN:

0277-786X

Type of media:

Conference paper

Type of material:

Language:

English

Keywords:

optical devices , SPIE , materials science , optical engineering

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