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Measurement of elastic properties of thin films by surface Brillouin scattering [4098-41]

Beghi, M. G. / Bottani, C. E. / Pastorelli, R. / SPIE - International Society for Optical Engineering

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Measurement of elastic properties of thin films by surface Brillouin scattering [4098-41]

Beghi, M. G. / Bottani, C. E. / Pastorelli, R. / SPIE - International Society for Optical Engineering

Measurement of elastic properties of thin films by surface Brillouin scattering [4098-41]

Beghi, M. G. / Bottani, C. E. / Pastorelli, R. / SPIE - International Society for Optical Engineering

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Titel:

Measurement of elastic properties of thin films by surface Brillouin scattering [4098-41]

Beteiligte:

Beghi, M. G. (Autor:in) / Bottani, C. E. (Autor:in) / Pastorelli, R. (Autor:in) / Andrews, D. L. / SPIE - International Society for Optical Engineering

Kongress:

Conference, Optical devices and diagnostics in materials science ; 2000 ; San Diego, CA

Erschienen in:

Optical devices and diagnostics in materials science ; 252-263

PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4098

Erscheinungsdatum:

01.01.2000

Format / Umfang:

12 pages

ISBN:

0819437433

ISSN:

0277-786X

Medientyp:

Aufsatz (Konferenz)

Format:

Sprache:

Englisch

Schlagwörter:

optical devices , SPIE , materials science , optical engineering

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