Structural analysis of chalcogenide waveguides using Rutherford backscattering spectroscopy (RBS) [4468-07]: Fid-Bau Portal

Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

Structural analysis of chalcogenide waveguides using Rutherford backscattering spectroscopy (RBS) [4468-07]

Rivero, C. A. / Sharek, P. S. / Nootz, G. / Lopez, C. / Richardson, K. A. / Schulte, A. / Irwin, R. / Galstian, T. / Hamel, V. / Turcotte, K. / ... [more]

Access

Check availability in my library

Order at Subito €

Page navigation

Document information

Export, share and cite

Structural analysis of chalcogenide waveguides using Rutherford backscattering spectroscopy (RBS) [4468-07]

Rivero, C. A. / Sharek, P. S. / Nootz, G. / Lopez, C. / Richardson, K. A. / Schulte, A. / Irwin, R. / Galstian, T. / Hamel, V. / Turcotte, K. / ... [more]

Structural analysis of chalcogenide waveguides using Rutherford backscattering spectroscopy (RBS) [4468-07]

Rivero, C. A. / Sharek, P. S. / Nootz, G. / Lopez, C. / Richardson, K. A. / Schulte, A. / Irwin, R. / Galstian, T. / Hamel, V. / Turcotte, K. / ... [more]

Access

Check availability in my library

Order at Subito €

Page navigation

Document information

Export, share and cite

Document information

Title:

Structural analysis of chalcogenide waveguides using Rutherford backscattering spectroscopy (RBS) [4468-07]

Contributors:

Rivero, C. A. (author) / Sharek, P. S. (author) / Nootz, G. (author) / Lopez, C. (author) / Richardson, K. A. (author) / Schulte, A. (author) / Irwin, R. (author) / Galstian, T. (author) / Hamel, V. (author) / Turcotte, K. (author)

Conference:

Conference, Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing ; 2001 ; San Diego, CA

Published in:

Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing ; 47-56

PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4468

Publication date:

2001-01-01

Size:

10 pages

ISBN:

ISSN:

Type of media:

Conference paper

Type of material:

Print

Language:

English

Keywords:

thin films , ion beams , nanoscale diagnostics , molecular manufacturing , SPIE

© Metadata Copyright the British Library Board and other contributors. All rights reserved.

Similar titles

Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis

Sie, S. H. | Springer Verlag | 1992

Quantitative Rutherford Backscattering from Thin Films

Chu, W. K. / Langouche, G. | British Library Online Contents | 1993

Thin-Film Morphology and Rutherford Backscattering Spectrometry

Hahn, T. / Metzner, H. / Gossla, M. et al. | British Library Online Contents | 1997

Electrostatic self-assembly processing of functional nanocomposites [4468-25]

Mecham, J. B. / Cooper, K. L. / Huie, K. et al. | British Library Conference Proceedings | 2001

Ion channelling Rutherford backscattering spectrometry structural characterization of CdS/CdTe heterostructures

Guerrieri, A. / Drigo, A. V. / Romanato, F. et al. | British Library Online Contents | 1993