Scanning Near-Field Infrared Microscopy: Fid-Bau Portal

International symposium, State-of-the-art application of surface and interface analysis methods to environmental material interactions ; 2001 ; Washington, DC

Published in:

State-of-the-art application of surface and interface analysis methods to environmental material interactions ; 134-138

PROCEEDINGS- ELECTROCHEMICAL SOCIETY PV

Publication date:

2001-01-01

Size:

5 pages

Remarks:

Held at the 199th meeting of the Electrochemical Society

ISBN:

1566773113

Type of media:

Conference paper

Type of material:

Language:

English

Keywords:

interface analysis methods , surface analysis methods , electrochemical , environmental material interactions

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Resolution and Contrast Generation in Scanning Near Field Optical Microscopy

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