Scanning Near-Field Infrared Microscopy: Fid-Bau Portal

International symposium, State-of-the-art application of surface and interface analysis methods to environmental material interactions ; 2001 ; Washington, DC

Erschienen in:

State-of-the-art application of surface and interface analysis methods to environmental material interactions ; 134-138

PROCEEDINGS- ELECTROCHEMICAL SOCIETY PV

Erscheinungsdatum:

01.01.2001

Format / Umfang:

5 pages

Anmerkungen:

Held at the 199th meeting of the Electrochemical Society

ISBN:

1566773113

Medientyp:

Aufsatz (Konferenz)

Format:

Sprache:

Englisch

Schlagwörter:

interface analysis methods , surface analysis methods , electrochemical , environmental material interactions

Talley, D. B. / Shaw, L. B. / Sanghera, J. S. et al. | British Library Online Contents | 2000

Chemical imaging with scanning near-field infrared microscopy and spectroscopy [4098-15]

Michaels, C. A. / Richter, L. J. / Cavanagh, R. R. et al. | British Library Conference Proceedings | 2000

Improved Probes for Scanning Near-Field Optical Microscopy

Suh, Y. D. / Zenobi, R. | British Library Online Contents | 2000

Near-Field Scanning Optical Microscopy Studies of Materials and Devices

Hsu, J. W. P. | British Library Online Contents | 1997

Resolution and Contrast Generation in Scanning Near Field Optical Microscopy

Fischer, U. Ch. | Springer Verlag | 1990

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