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    Study of the Brittle Fracture of Monocrystalline Silicon Wafers

    New search for: Barredo, J.
    New search for: Fraile, A.
    New search for: Alarcon, E.
    New search for: Topping, B. H. V.

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    Study of the Brittle Fracture of Monocrystalline Silicon Wafers

    New search for: Barredo, J.
    New search for: Fraile, A.
    New search for: Alarcon, E.
    New search for: Topping, B. H. V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Study of the Brittle Fracture of Monocrystalline Silicon Wafers

    New search for: Barredo, J.
    New search for: Fraile, A.
    New search for: Alarcon, E.
    New search for: Topping, B. H. V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Study of the Brittle Fracture of Monocrystalline Silicon Wafers

    Contributors:

    Barredo, J. (author) / Fraile, A. (author) / Alarcon, E. (author) / Topping, B. H. V.

    Conference:

    10th, International conference on civil, structural and environmental engineering computing ; 2005 ; Rome, Italy

    Published in:

    International conference on civil, structural and environmental engineering computing ; 247-248

    CIVIL COMP

    Publication date:

    2005-01-01

    Size:

    2 pages

    Remarks:

    Held concurrently with The Eighth International Conference on the Application of Artificial Intelligence to Civil, Structural and Environmental Engineering (AICivil-Comp 2005)" - Pref.; HELD ON CD ROM

    ISBN:

    1905088000 , 1905088019 , 1905088027

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    Civil engineering , Structural engineering , Environmental engineering , Computer-aided engineering

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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