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Ellipsometry porosimetry: fast and nondestructive technique to characterize porosity of cubic mesoporous TiO~2 thin films [6647-18]
Ellipsometry porosimetry: fast and nondestructive technique to characterize porosity of cubic mesoporous TiO~2 thin films [6647-18]
Ellipsometry porosimetry: fast and nondestructive technique to characterize porosity of cubic mesoporous TiO~2 thin films [6647-18]
Bondaz, A. (author) / Kitzinger, L. (author) / Defranoux, C. (author) / Smith, G.B. / Cortie, M.B. / Society of Photo-optical Instrumentation Engineers
Conference, Nanocoatings (Conference) ; 2007 ; San Diego, CA
2007-01-01
6647 0H
Conference paper
English
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