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Characterization of radio-frequency sputtered AIN films by spectroscopic ellipsometry [6647-23]
Characterization of radio-frequency sputtered AIN films by spectroscopic ellipsometry [6647-23]
Characterization of radio-frequency sputtered AIN films by spectroscopic ellipsometry [6647-23]
Huang, D. (author) / Uppireddi, K. (author) / Pantojas, V.M. (author) / Otano-Rivera, W. (author) / Weiner, B.R. (author) / Morell, G. (author) / Smith, G.B. / Cortie, M.B. / Society of Photo-optical Instrumentation Engineers
Conference, Nanocoatings (Conference) ; 2007 ; San Diego, CA
2007-01-01
6647 0M
Conference paper
English
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